Equotip portable hardness tester Leeb, Rockwell & UCI

WA : 08170777190 /081398831288

Overcome the limitations of stationary bench top hardness testing

Proceq's Equotip enables portable hardness inspection of almost any object, polished parts and heat-treated surfaces. The hardness measurements are made by using the dynamic rebound testing method according to Leeb, the static Portable Rockwell hardness test and the Ultrasonic Contact Impedance (UCI) method. The rugged Swiss-made hardness tester are designed for portable hardness testing in the lab, in the workshop, at production facilities or on site. Proceq's latest innovation is Equotip Live featuring a wireless impact device, mobile app, real-time data sharing and cloud backup.
Since Proceq invented the Leeb hardness test principle in 1975, Equotip has become established as a globally recognized brand for portable hardness testing and a de facto industry standard. A wide range of different impact devices, as well as a comprehensive selection of test blocks and accessories cover most applications.

Models

	Equotip Live UCI	Equotip Live Leeb D	Equotip 550 UCI	Equotip 550 Portable Rockwell	Equotip 550 Leeb	Equotip Piccolo / Bambino 2

Description	Equotip Live UCI creates new opportunities for collaboration in portable hardness testing. The Equotip iOS app allows you to conduct measurements at a remote location and provide instant access of your results to your team.	The world’s first full IoT portable wireless hardness testing solution with real-time data sharing, cloud backup and intuitive user interface. The ultra portable Equotip Live Leeb D impact device is perfect for use in confined spaces.	Flexible UCI hardness tester for fine-grained material with any shape and heat-treated surfaces. The patented adjustable test load enables a wide range of applications. Rugged touchscreen with enhanced software features and analysis functions. Equotip 540 for regular basic usage without extensive reporting needs.	Portable Rockwell hardness tester for scratch-sensitive, polished and thin parts. It features excellent sensitivity through small penetration of a few micrometer. Rugged touchscreen with enhanced software features and analysis functions.	Versatile Leeb hardness tester for on-site testing of heavy, large or installed parts. Rugged touchscreen designed to provide an exceptional user experience and best possible measuring and analysis. Enhanced software features and analysis functions. Equotip 540 for regular basic usage without extensive reporting needs.	Fully integrated and handy Leeb hardness tester with a compact and robust housing. Ideally suited for quick on-site hardness tests. Optional DL probe for confined spaces and recessed surfaces. Equotip Piccolo 2 allows the transfer of the data to a PC.
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Your Benefits	Wireless UCI probe Instantly share your measurements and reports Logbook for full data traceability	Wireless impact device and clean user-interface Easily share your measurements and reports in real-time worldwide Logbook for full data traceability and to add media	Combine with Leeb and Portable Rockwel On-screen feedback to reduce measurement inaccuracies caused by the operator Ready-to-go reports through powerful built-in reporting feature	Combine with Leeb and UCI Equally reliable, accurate and standardized but faster than stationary Rockwell hardness testers Ready-to-go reports through powerful built-in reporting feature	Use full Leeb probe portfolio and combine with Portable Rockwell and UCI Comes with the high accuracy known for all Equotip products Ready-to-go reports through powerful built-in reporting feature	Entry model for quick on-site tests Compact housing and automatic angle correction allow flexible use Comes with the high accuracy known for all Equotip products
Native Scale	HV (UCI)	HL	HV (UCI)	µm, µinch	HL	HL
Measuring Range	20 – 2000 HV	150 - 950 HL	20 - 2000 HV	0 - 100 µm; 19 - 70 HRC; 35 - 1‘000 HV	150 - 950 HL	150 – 950 HL
Measuring Accuracy	± 2% (150 – 950 HV)	± 4 HL (0.5% at 800 HL)	± 2% (150 - 950 HV)	± 0.8 µm; ~ ± 1.0 HRC	± 4 HL (0.5% at 800 HL)	± 4 HL (0.5% at 800 HL)
Available Scales	HB, HV, HLD, HRA, HRB, HRC, HR15N, HR15T, MPA	HB, HV, HRB, HRC, HS, MPA	HB, HV, HRA, HRB, HRC, HR15N, HR15T, MPA	HB, HV, HRA, HRB, HRC, R15N, HR15T, HMMRC, MPA	HB, HV, HRA, HRB, HRC, HS, MPA	HB, HV, HRB, HRC, HS, MPA (Equotip Piccolo 2 only)
Available Probes	Universal probe with adjustable test load between HV1 and HV10	Leeb D	UCI (Adjustable HV1 - HV5)	Portable Rockwell Probe 50N (can also be connected directly to PC)	Leeb D / DC / DL / S / E / G / C	Leeb D / DL
Combination With Other Methods			Leeb, Portable Rockwell	Leeb, UCI	Portable Rockwell, UCI
Average Roughness Ra (µm / µinch)	12.5 / 500	2 / 80	12.5 / 500	2 / 80	7 / 275 (Leeb G)	2 / 80
Minimum Mass (kg / lbs)	0.3 / 0.66	0.05 / 0.2	0.3 / 0.66	No requirement	0.02 / 0.045 (Leeb C)	0.05 / 0.2
Minimum Thickness (mm / inch)	5 / 0.2	3 / 0.12	5 / 0.2	10 x indendation depth	1 / 0.04 (Leeb C)